{"id":6038,"date":"2005-04-01T12:10:24","date_gmt":"2005-04-01T03:10:24","guid":{"rendered":"https:\/\/micronix-jp.com\/english\/?post_type=product&#038;p=6038"},"modified":"2023-03-31T16:02:54","modified_gmt":"2023-03-31T07:02:54","slug":"discontinued-productetc-inspection-system-for-obe-production-me8600","status":"publish","type":"product","link":"https:\/\/micronix-jp.com\/english\/products\/etc\/me8600.html","title":{"rendered":"[Discontinued Product]ETC Inspection System For OBE Production ME8600"},"content":{"rendered":"<ul class=\"wp-block-list\"><li>This is a low cost version automatic test system developed for OBE (on Board Equipment) production lines.<\/li>\n\n<li>It is also good for wireless system tests, protocol tests, dynamic operation tests and communication tests.<\/li><\/ul><div class=\"wp-block-vk-blocks-table-of-contents-new vk_tableOfContents vk_tableOfContents-style-default tabs\"><div class=\"tab\"><div class=\"vk_tableOfContents_title\">\u76ee\u6b21<\/div><input type=\"checkbox\" id=\"chck1\"\/><label class=\"tab-label vk_tableOfContents_openCloseBtn button_status button_status-close\" for=\"chck1\"><\/label><ul class=\"vk_tableOfContents_list tab_content-close\"><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-2\" data-reactroot=\"\"><a href=\"#vk-htags-d8c3b53d-9bea-4b56-a5d8-4881123444e0\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">1. <\/span>Features<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-3\" data-reactroot=\"\"><a href=\"#vk-htags-0170a59c-2a93-4e0c-a34d-4f9100fca33a\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">1.1. <\/span>All the tests during production of OBE can be conducted.<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-3\" data-reactroot=\"\"><a href=\"#vk-htags-419b6fee-50f1-4318-9b61-70a70cab1ee5\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">1.2. <\/span>All the tests are conducted automatically.<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-3\" data-reactroot=\"\"><a href=\"#vk-htags-335bb4f9-7e76-4b35-873e-6516344f3738\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">1.3. <\/span>Test results are printed on an inspection sheet.<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-3\" data-reactroot=\"\"><a href=\"#vk-htags-eef854d4-ac25-4857-b885-ede327b84a6e\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">1.4. <\/span>More compact with rack accommodation.<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-3\" data-reactroot=\"\"><a href=\"#vk-htags-7239483a-5bd5-4bfd-a512-8a433305061e\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">1.5. <\/span>Low price<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-2\" data-reactroot=\"\"><a href=\"#vk-htags-4f71820c-4e00-44dc-9144-bf5c2c2e9afe\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">2. <\/span>System composition<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-2\" data-reactroot=\"\"><a href=\"#vk-htags-64b9969b-0f98-46b7-b100-6887e034745e\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">3. <\/span>Test item<\/a><\/li><li class=\"vk_tableOfContents_list_item vk_tableOfContents_list_item-h-2\" data-reactroot=\"\"><a href=\"#vk-htags-981a264f-c278-422f-a84a-77ed49b9cfe1\" class=\"vk_tableOfContents_list_item_link\"><span class=\"vk_tableOfContents_list_item_link_preNumber\">4. <\/span>Test system and optional<\/a><\/li><\/ul><\/div><\/div><h2 class=\"wp-block-heading\" id=\"vk-htags-d8c3b53d-9bea-4b56-a5d8-4881123444e0\">Features<\/h2><h3 class=\"wp-block-heading\" id=\"vk-htags-0170a59c-2a93-4e0c-a34d-4f9100fca33a\">All the tests during production of OBE can be conducted.<\/h3><ul class=\"wp-block-list\"><li>Wireless system test (receiving sensitivity and burst BER measurement in options are included, and it is 12 items.)<\/li>\n\n<li>Protocol test (basic operation test of ARIB)<\/li>\n\n<li>Dynamic operation test<\/li>\n\n<li>Communication test<\/li><\/ul><h3 class=\"wp-block-heading\" id=\"vk-htags-419b6fee-50f1-4318-9b61-70a70cab1ee5\">All the tests are conducted automatically.<\/h3><p>Set an OBE in <a href=\"https:\/\/micronix-jp.com\/english\/products\/shield-box\/small-medium-type\/me8661a.html\">the small-size shielding box ME8661A<\/a> and click [Test start] on the host computer. All the test items are executed automatically without human intervention.<\/p><h3 class=\"wp-block-heading\" id=\"vk-htags-335bb4f9-7e76-4b35-873e-6516344f3738\">Test results are printed on an inspection sheet.<\/h3><p>Test results are printed on an inspection sheet of the user\u2019s specified format on termination of a test. The customer is requested to give us the specified format at the time of placement of an order. The expenses for creation of inspection sheets are included in the standard system price.<\/p><h3 class=\"wp-block-heading\" id=\"vk-htags-eef854d4-ac25-4857-b885-ede327b84a6e\">More compact with rack accommodation.<\/h3><p>The equipment is accommodated in a rack of height 1080mm (including castors), except for <a href=\"https:\/\/micronix-jp.com\/english\/products\/shield-box\/small-medium-type\/me8661a.html\">the small-size shielding box ME8661A<\/a>, host computer and printer.<\/p><h3 class=\"wp-block-heading\" id=\"vk-htags-7239483a-5bd5-4bfd-a512-8a433305061e\">Low price<\/h3><p>Price reduction was materialized by development of RSU simulator in our company and also by narrowing wireless system test items to important ones only.<\/p><h2 class=\"wp-block-heading\" id=\"vk-htags-4f71820c-4e00-44dc-9144-bf5c2c2e9afe\">System composition<\/h2><p>*Please refer to \u201c<a href=\"https:\/\/micronix-jp.com\/english\/products\/etc\/me8600.html#SystemOption\">Test system and optional<\/a>\u201c.<\/p><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th>Item<\/th><th>Explanation of the contents<\/th><\/tr><tr><td>RSU simulator ME8610<\/td><td>Simple frame master RSU and ASK standard signal generator<\/td><\/tr><tr><td>Control and measurement equipment ME8620<\/td><td>Detector, Digitizer, Frequency counter, Microwave signal switching equipment<br>[Optional ]BER measuring circuit, Programmable attenuator<\/td><\/tr><tr><td>Power meter<\/td><td>Main frame ML2437A, Power sensor MA2472A<\/td><\/tr><tr><td>RF spectrum analyzer<\/td><td>Main frame MS2665C, Standard crystal oscillator<\/td><\/tr><tr><td><a href=\"https:\/\/micronix-jp.com\/english\/products\/shield-box\/small-medium-type\/me8661a.html\">Small-size shielding box ME8661A<\/a><\/td><td>Shielding box for free space measurement<\/td><\/tr><tr><td>Microwave coaxial cable\u3000(3m)<\/td><td>Maximum frequency : 18.5Hz<\/td><\/tr><tr><td>CoaxialD-subCableC\u3000(3m)<\/td><td>For connection of ME8620 and <a href=\"https:\/\/micronix-jp.com\/english\/products\/shield-box\/small-medium-type\/me8661a.html\">ME8661A<\/a>.*1<\/td><\/tr><tr><td>Host computer<\/td><td>With GP-IB board<\/td><\/tr><tr><td>A4 printer<\/td><td>The test result printed out on A4 paper<\/td><\/tr><tr><td>Software\u3000MAS860<\/td><td>Basic test software.<\/td><\/tr><tr><td colspan=\"2\">Option<\/td><\/tr><tr><td>Option A<\/td><td>Receiving sensitivity test<\/td><\/tr><tr><td>Option \uff22<\/td><td>Burst BER measurement<\/td><\/tr><tr><td>Option \uff23<\/td><td>Communication test (R \/ W)<\/td><\/tr><tr><td>Option \uff25<\/td><td>Dynamic operation test<\/td><\/tr><\/tbody><\/table><\/figure><p>[*1]Signal of coaxial D-sub connector<\/p><p>Coaxial D-sub connector consists of 7 coaxial lines and 17 single lines.<\/p><h2 class=\"wp-block-heading\" id=\"vk-htags-64b9969b-0f98-46b7-b100-6887e034745e\">Test item<\/h2><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th style=\"text-align:center\">Wireless system test<\/th><th style=\"text-align:center\">Note<\/th><\/tr><tr><td>1. Deviation of antenna power<\/td><td>Measure peak power<\/td><\/tr><tr><td>2. Frequency deviation<\/td><td><\/td><\/tr><tr><td>3. Strength of spurious emission<\/td><td><\/td><\/tr><tr><td>4. Tolerance of occupied frequency bandwidth<\/td><td><\/td><\/tr><tr><td>5. Carrier off leakage power<\/td><td><\/td><\/tr><tr><td>6. Modulation factor<\/td><td><\/td><\/tr><tr><td>7. Adjacent channel leakage power<\/td><td><\/td><\/tr><tr><td>8. Transmission opening eye ratio<\/td><td><\/td><\/tr><tr><td>9. Signal transmission speed<\/td><td>Measure TxC or \u201c0\u201d \u201c1\u201d modulation signal of OBE. *2<\/td><\/tr><tr><td>10. Receiving sensitivity<\/td><td>[Optional A]Measure RxC and RxD of OBE. *3<\/td><\/tr><tr><td>11. Strength of radio wave emitted secondarily<\/td><td><\/td><\/tr><tr><td>12. Burst BER measurement<\/td><td>[OptionA]Measure RxC and RxD of OBE. *4<\/td><\/tr><\/tbody><\/table><\/figure><p>[*2]Selection of the signal source for signal transmission speed test.<\/p><p>One out of the following can be selected as the signal source for \u201csignal transmission speed\u201d test.<\/p><ol class=\"wp-block-list\"><li>\u201cTxC\u201d signal taken out of the OBE to be tested.<\/li>\n\n<li>Signal produced by waveform shaping after detection of output signal in the state where the output mode of the OBE to be tested is set at repeating of \u201c0\u201d and \u201c1\u201d \u2026 There is a possibility of dispersion arising in measured values due to noise, if this signal source is used.<\/li><\/ol><p>[*3]RxC and RxD for receiving sensitivity test<\/p><p>In a \u201creceiving sensitivity\u201d test it is necessary to take \u201cRxC (receiving clock)\u201d and \u201cRxD (receiving data)\u201d out of the OBE to be tested. If RxC and RxD cannot be taken out, a simple method to substitute the test with a communication test is available. Please contact us for such a method.<\/p><p>[*4]Connection of burst BER measurement<\/p><p>The method illustrated below using a circulator is the standard connection for burst BER measurement.<\/p><figure class=\"wp-block-image aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"477\" height=\"130\" src=\"https:\/\/micronix-jp.com\/english\/wp-content\/uploads\/sites\/2\/2023\/03\/ME8600b1.gif\" alt=\"\" class=\"wp-image-9000\"\/><\/figure><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th style=\"text-align:center\">Wireless system test<\/th><th style=\"text-align:center\">Note<\/th><\/tr><tr><td>1.Check of ACTC transmission<\/td><td rowspan=\"14\">Whether the operation is normal or not is displayed on the host computer.<\/td><\/tr><tr><td>2.Check of ACTC transmission stop-maximum number of transmission times<\/td><\/tr><tr><td>3.Check of ACTC transmission stop-ACPI<\/td><\/tr><tr><td>4.Check of ACTC transmission stop-FCMC entry<\/td><\/tr><tr><td>5.Receiving of BST<\/td><\/tr><tr><td>6.Transmission of VST<\/td><\/tr><tr><td>7.End procedure 1<\/td><\/tr><tr><td>8.End procedure 2<\/td><\/tr><tr><td>9.Transmission and receiving of data<\/td><\/tr><tr><td>10.Transmission and receiving of data-Continuance<\/td><\/tr><tr><td>11.Transmission and receiving of data-Duplicate reject function<\/td><\/tr><tr><td>12.Transmission and receiving of data- OBE resending function<\/td><\/tr><tr><td>13.Transmission and receiving of data-OBE resending demand function<\/td><\/tr><tr><td>14.WCNC transmission function<\/td><\/tr><\/tbody><\/table><\/figure><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th style=\"text-align:center\">Communication test<\/th><th style=\"text-align:center\">Note<\/th><\/tr><tr><td>R\/W Test<\/td><td>[Optional C] The sequence to write data (W) to the OB and to read it (R) is repeated.<\/td><\/tr><\/tbody><\/table><\/figure><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th style=\"text-align:center\">Dynamic operation test<\/th><th style=\"text-align:center\">Note<\/th><\/tr><tr><td>1.Usual run test<\/td><td rowspan=\"4\">[Optional E]<\/td><\/tr><tr><td>2.Low-speed run test<\/td><\/tr><tr><td>3.High-speed run test<\/td><\/tr><tr><td>Concerning each above-mentioned test: Ideal pattern-OBE maximum input Ideal pattern-OBE minimum input Real pattern A Real pattern B Adjacent lane run pattern Shadow wing pattern<\/td><\/tr><\/tbody><\/table><\/figure><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th style=\"text-align:center\">Signal name<\/th><th style=\"text-align:center\">Kind of line<\/th><th style=\"text-align:center\">Contents<\/th><\/tr><tr><td>TxC<\/td><td style=\"text-align:center\">Coaxial line<\/td><td>Transmission clock. Signal for test of \u201csignal transmission speed\u201d<\/td><\/tr><tr><td>RxC<\/td><td style=\"text-align:center\">\u201c<\/td><td>Receiving clock. Signal for test of \u201creceiving sensitivity\u201d and \u201cburst BER measurement\u201d<\/td><\/tr><tr><td>RxD<\/td><td style=\"text-align:center\">\u201c<\/td><td>Receiving data. Signal for test of \u201creceiving sensitivity \u201d and \u201cburst BER measurement\u201d<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\">\u201c<\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\">\u201c<\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\">\u201c<\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\">\u201c<\/td><td>Reserve<\/td><\/tr><tr><td>OBE CONT-0<\/td><td style=\"text-align:center\">Signal line<\/td><td>Control signal for setup of OBE \u2018s output mode. * It is possible to change to the setup using RS-232C and reserved terminals may be used. (But additional expenses are required elsewhere.)<\/td><\/tr><tr><td>OBE CONT-1<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td>OBE CONT-2<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td>OBE CONT-3<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td>OBE CONT-4<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td>OBE CONT-5<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td>OBE CONT-6<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td>OBE CONT-7<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><tr><td><\/td><td style=\"text-align:center\"><\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\"><\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\"><\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\"><\/td><td>Reserve<\/td><\/tr><tr><td><\/td><td style=\"text-align:center\"><\/td><td>Reserve<\/td><\/tr><tr><td>GND<\/td><td style=\"text-align:center\">\u201c<\/td><td>Ground<\/td><\/tr><tr><td>GND<\/td><td style=\"text-align:center\">\u201c<\/td><td>Ground<\/td><\/tr><tr><td>+5V<\/td><td style=\"text-align:center\">\u201c<\/td><td>Power supply for buffer circuits in ME8661A. And power supply for OBE under test . (changing into 12V by DC-DC converter).<\/td><\/tr><tr><td>+5V<\/td><td style=\"text-align:center\">\u201c<\/td><td><\/td><\/tr><\/tbody><\/table><\/figure><h2 class=\"wp-block-heading\" id=\"vk-htags-981a264f-c278-422f-a84a-77ed49b9cfe1\">Test system and optional<\/h2><figure class=\"wp-block-flexible-table-block-table\"><table class=\"\"><tbody><tr><th style=\"text-align:center\">System name<\/th><th style=\"text-align:center\">Hard addition<\/th><th style=\"text-align:center\">Software name<\/th><th style=\"text-align:center\">Functions<\/th><\/tr><tr><td>Automatic inspection system<br>ME8600<\/td><td><\/td><td>MAS860<\/td><td>Wireless system test\u30fbProtocol test\u30fbDynamic operation test\u30fbCommunication test<\/td><\/tr><tr><td>Protocol and communication test system ME8607<\/td><td><\/td><td>MAS867<\/td><td>Protocol test\u30fbCommunication test<\/td><\/tr><tr><td>Optional A<\/td><td><\/td><td>MAS86A<\/td><td>Receiving sensitivity<\/td><\/tr><tr><td>Optional B<\/td><td><\/td><td>MAS86B<\/td><td>Burst BER measurement<\/td><\/tr><tr><td>Optional C<\/td><td><\/td><td>MAS86C<\/td><td>Communication test(R\/W)<\/td><\/tr><tr><td>Optional E<\/td><td><\/td><td>MAS86E<\/td><td>Dynamic operation test<\/td><\/tr><\/tbody><\/table><\/figure><p>ETC inspection system for OBE production ME8600<\/p><figure class=\"wp-block-image aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"608\" height=\"289\" src=\"https:\/\/micronix-jp.com\/english\/wp-content\/uploads\/sites\/2\/2023\/03\/ME8600c.gif\" alt=\"\" class=\"wp-image-9002\"\/><\/figure><div class=\"wp-block-cover is-light vk_block-margin-xl--margin-top\"><span aria-hidden=\"true\" class=\"wp-block-cover__background has-white-background-color has-background-dim\"><\/span><img class=\"wp-block-cover__image-background wp-image-8105\" alt=\"\" src=\"https:\/\/micronix-jp.com\/wp-content\/uploads\/2022\/11\/contact_cta_cover.png\" data-object-fit=\"cover\"\/><div class=\"wp-block-cover__inner-container is-layout-flow wp-block-cover-is-layout-flow\"><p class=\"has-text-align-center has-huge-font-size\"><strong>Please feel free to contact us.<\/strong><\/p>\n\n<p>If you want to verify 5G, customize a radio wave shield box, or need product repair, please do not hesitate to contact us about any small matter.<\/p>\n\n<div class=\"wp-block-vk-blocks-grid-column vk_gridColumn\"><div class=\"row\"><div class=\"wp-block-vk-blocks-grid-column-item vk_gridColumn_item col-12 col-sm-12 col-md-12 col-lg-12 col-xl-12 col-xxl-12\"><div class=\"wp-block-vk-blocks-button vk_button vk_button-color-custom vk_button-align-block is-style-shine\"><a href=\"https:\/\/micronix-jp.com\/english\/contact\/\" class=\"vk_button_link btn has-background has-luminous-vivid-orange-background-color btn-lg btn-block\" role=\"button\" aria-pressed=\"true\" target=\"_blank\" rel=\"noopener\"><div class=\"vk_button_link_caption\"><i class=\"far fa-envelope vk_button_link_before\" aria-hidden=\"true\"><\/i><span class=\"vk_button_link_txt\"><strong>Contact Form<\/strong><\/span><\/div><\/a><\/div><\/div><\/div><\/div><\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>The low-priced ETC inspection system developed for OBE production line. <\/p>\n","protected":false},"featured_media":6068,"template":"","meta":{"vkexunit_cta_each_option":""},"product_cat":[91],"product_tag":[100],"class_list":{"0":"post-6038","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-shop-category-discontinued-product","7":"product_tag-tag-etc-inspection-system-for-obe-production","9":"first","10":"instock","11":"shipping-taxable","12":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/product\/6038","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/media\/6068"}],"wp:attachment":[{"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/media?parent=6038"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/product_cat?post=6038"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/micronix-jp.com\/english\/wp-json\/wp\/v2\/product_tag?post=6038"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}